发明名称 Measurement device and measuring method using simulated uplink fading
摘要 A measuring device for measuring a reaction of a device under test to an uplink channel quality parameter, indicating a quality of a transmission channel from the device under test to the measuring device, comprises signal generation means, set up for generating a first signal including the uplink channel quality parameter. The uplink channel quality parameter is set by the signal generation means independent from an actual channel quality of the transmission channel. Transmission means is set up for transmitting a second signal, which is derived from the first signal or is identical to the first signal to the device under test. Receiving means is set up for receiving a third signal transmitted by the device under test and created by the device under test based upon the uplink channel quality parameter and for determining the reaction of the device under test to the uplink channel quality parameter.
申请公布号 US9634778(B2) 申请公布日期 2017.04.25
申请号 US201314768224 申请日期 2013.02.18
申请人 Rohde & Schwarz GmbH & Co. KG 发明人 Gruber Ingo
分类号 H04B17/00;H04L5/00;H04W24/08;H04B17/391;H04W24/06;H04B17/309 主分类号 H04B17/00
代理机构 Potomac Technology Law, LLC 代理人 Potomac Technology Law, LLC
主权项 1. A measuring device, comprising: a signal generator configured to generate a first signal that includes an uplink channel quality parameter indicating a quality of a transmission channel from a device under test to the measuring device, and to set the uplink channel quality parameter independent of actual channel quality of the transmission channel from the device under test to the measuring device; a fader configured to perform a fading of the first signal; a transmitter configured to transmit a downlink signal to the device under test, wherein the downlink signal is based on a result of the fading of first signal; a receiver configured to receive an uplink signal from the device under test, wherein the uplink signal is based on the uplink channel quality parameter, and includes a downlink channel quality parameter generated by the device under test based on a quality of the downlink signal transmitted to the device under test; and a processor configured to determine, based on the uplink signal, a reaction of the device under test to the uplink channel quality parameter, and the downlink channel quality parameter; and wherein the signal generator is configured to set the uplink channel quality parameter as being equal to the received downlink channel quality parameter.
地址 Munich DE