发明名称 |
Retention logic for non-volatile memory |
摘要 |
An integrated circuit memory device includes an array of non-volatile, charge trapping memory cells, configured to store data values in memory cells in the array using threshold states, including a higher threshold state. Retention check logic executes to identify memory cells in the higher threshold state which fail a threshold retention check. Also, logic is provided to reprogram the identified memory cells. |
申请公布号 |
US9514834(B2) |
申请公布日期 |
2016.12.06 |
申请号 |
US201514867660 |
申请日期 |
2015.09.28 |
申请人 |
MACRONIX INTERNATIONAL CO., LTD. |
发明人 |
Hung Chun-Hsiung;Kuo Nai-Ping;Chang Kuen-Long;Chen Ken-Hui;Wang Yu-Chen |
分类号 |
G11C29/00;G11C16/34;G11C29/12;G11C16/04;G11C16/10;G11C16/26;G11C16/30 |
主分类号 |
G11C29/00 |
代理机构 |
Haynes Beffel & Wolfeld LLP |
代理人 |
Haynes Beffel & Wolfeld LLP |
主权项 |
1. A memory device, comprising:
an array of memory cells, configured to store data values in memory cells in the array using threshold states, including a higher threshold state; and a controller including retention check logic to identify memory cells in the higher threshold state having threshold voltages which fail a retention threshold check, and including logic to execute, responsive to the memory device entering any of a read mode and a write mode, a retention write on the identified memory cells in the higher threshold state. |
地址 |
Hsinchu TW |