发明名称 Retention logic for non-volatile memory
摘要 An integrated circuit memory device includes an array of non-volatile, charge trapping memory cells, configured to store data values in memory cells in the array using threshold states, including a higher threshold state. Retention check logic executes to identify memory cells in the higher threshold state which fail a threshold retention check. Also, logic is provided to reprogram the identified memory cells.
申请公布号 US9514834(B2) 申请公布日期 2016.12.06
申请号 US201514867660 申请日期 2015.09.28
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 Hung Chun-Hsiung;Kuo Nai-Ping;Chang Kuen-Long;Chen Ken-Hui;Wang Yu-Chen
分类号 G11C29/00;G11C16/34;G11C29/12;G11C16/04;G11C16/10;G11C16/26;G11C16/30 主分类号 G11C29/00
代理机构 Haynes Beffel & Wolfeld LLP 代理人 Haynes Beffel & Wolfeld LLP
主权项 1. A memory device, comprising: an array of memory cells, configured to store data values in memory cells in the array using threshold states, including a higher threshold state; and a controller including retention check logic to identify memory cells in the higher threshold state having threshold voltages which fail a retention threshold check, and including logic to execute, responsive to the memory device entering any of a read mode and a write mode, a retention write on the identified memory cells in the higher threshold state.
地址 Hsinchu TW
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