发明名称 HEATING DEVICE FOR SPECIMEN
摘要 PURPOSE:To prevent a specimen holder of an X-ray diffracting device, by employing tantalum for building a high-temperature specimen holder of a specimen heating device. CONSTITUTION:After a specimen is set on a specimen holder made of tantalum plate, the specimen is analyzed by conducting an X-ray diffraction at a high temperature using a specimen heating device. While platinum has conventionally been used for making the specimen holder, when an X-ray diffraction of a samarium-cobalt type magnet is executed at a high temperature, since samarium is a metal which is easily evaporated at a high temperature, samarium and plattinum react with each other allowing a compound called Sm2Pt to be formed on the surface of the specimen holder and causing the specimen holder to become brittle and vulnerable, and thus occurring damage is prevented by taking advantage of the chemical characteristic that tantalum and rare earth element do not produce any intermetallic compound.
申请公布号 JPS57110944(A) 申请公布日期 1982.07.10
申请号 JP19800188438 申请日期 1980.12.27
申请人 SUWA SEIKOSHA KK 发明人 OGUCHI TAMIO
分类号 G01N23/20;G01N25/00 主分类号 G01N23/20
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