发明名称 MEASURING DEVICE FOR SURFACE DEFECT
摘要 PURPOSE:To enable the accurate detection of a condition of a resistance surface without consumption of a consuming material, by mounting an electrode, contacting a resistance body, a means for applying a voltage between the resistance body surface and said electrode, and a means for detecting a current flowing to said electrode. CONSTITUTION:An electrode 2 is constituted such that it slides a peripheral surface of a luminous body drum 1 being of a resistance body. A detecting part 4 includes a power source circuit, generating a voltage applied to the electrode 2, and a circuit for discriminating and processing a defect by means of a current value. A detecting part transfer mechanism 4 is constituted such that it transfers said electrode and a detecting part by the full length of the drum 1 and in a direction of a rotary shaft. A luminou drum 1 is tured at a specified peripheral speed to bring the electrode 2 into contact with a luminous body surface, and meanwhile, a voltage is applied by a power source circuit 5 to record a change in current by a processing circuit 7. By obtaining a reading of the current change quantity, a defect can be decided not based on subjectivity of an operator.
申请公布号 JPS57192847(A) 申请公布日期 1982.11.27
申请号 JP19810077768 申请日期 1981.05.22
申请人 CANON KK 发明人 JINGUUJI TOORU;KUMASAKA HIROSHI
分类号 G01N27/20;G03G5/00 主分类号 G01N27/20
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