发明名称 BLOCK REDUNDANCY FOR MEMORY ARRAY
摘要 <p>14 Block redundancy is utilized to improve yield and lower die cost for an electrically programmable read only memory (EPROM). The EPROM is organized 8Kx8 with four primary memory blocks (12A,12B,12C,12D) on each side of a central row decoder. Each block includes an array (M) of memory cells, column select (CS), column decode (CD), sense amp (SA), data buffer (DB) and other overhead circuitry. One block of redundant circuitry (12RB-1) is also provided for each set of four blocks and includes a redundant memory matrix (RM), a redundant column decoder (RCD), a redundant column select (RCS), a redundant sense amp (RSA) and a redundant data buffer (RDB). Incorporated within each primary memory block is a multiplex logic circuit (MUX) which is independently programmable to selectively disconnect the associated primary memory block and substitute the redundant memory block, including the redundant column decoder, column select, sense amp and data buffer. Each multiplex logic circuit (26) includes a polysilicon fuse (30) which is permanently programmable from a closed to an open circuit condition by applying a high voltage to the external data bit terminal (P1)which corresponds with the defective memory block bells.</p>
申请公布号 CA1163374(A) 申请公布日期 1984.03.06
申请号 CA19810370650 申请日期 1981.02.11
申请人 MOSTEK CORPORATION 发明人 MCKENNEY, VERNON G.;TAYLOR, DAVID L.
分类号 G11C17/00;G11C11/401;G11C29/00;G11C29/04;(IPC1-7):G06F11/16 主分类号 G11C17/00
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