发明名称 X-RAY EXAMINATION APPARATUS
摘要 An X-ray examination apparatus for examination of composite objects, such as, for example, peripheral examination of patients, comprises, in order to avoid over-radiation of the detection system by radiation passing along the object, a filter that can be adapted to the interstices. Such a filter consists, for example, of a body of radiation-absorbing material having in two directions a varying radiation absorption, for example in the form of a double wedge.
申请公布号 JPS60156437(A) 申请公布日期 1985.08.16
申请号 JP19840268715 申请日期 1984.12.21
申请人 PHILIPS' GLOEILAMPENFABRIEKEN NV 发明人 YOZEFU SEODORASU ANTONIUSU YANSEN;HERARUDO NIBEE
分类号 G01N23/04;A61B6/00;A61B6/03;A61B6/10;G21K1/10 主分类号 G01N23/04
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