发明名称 INSPECTING APPARATUS
摘要 <p>PURPOSE:To reduce the cost by moving a stage which places a wafer, moving an image sensor for sensing the wafer, and detecting a repetition pattern on the wafer. CONSTITUTION:A controller 13 is operated by a command from a computer, sensors 5, 6 detect the profile position of an IC chip to move a stage 12 so that an IC ship 19 is seen in a visual field 12 of a sensor 11 by position signals 5a, 6a. The sensor detects a street 20 by the signal waveforms of the sensors 5, 6, and applies the value to a circuit 18. The field 21 of the sensor 11 is moved by driving a motor 8 by a command from the controller 13 to move the stage 10. A signal 11a is applied to a circuit 15 synchronously with the output pulse of an encoder 9 to indicate the position of the sensor 11. The circuit 15 digitally converts a video analog signal, writes the signal in a memory 16 to inspect regions lxXly from the position x0, y0 on the basis of the data applied to the circuit 18. Thus, since a wafer stage merely conveys an element to be inspected to an optical system position in rough accuracy, it can be extremely inexpensively composed.</p>
申请公布号 JPS6273716(A) 申请公布日期 1987.04.04
申请号 JP19850214030 申请日期 1985.09.27
申请人 FUJITSU LTD 发明人 TSUKAHARA HIROYUKI;HIZUKA TETSUO;HIRAOKA NORIYUKI;NAKAJIMA MASAHITO
分类号 G01N21/88;G01N21/956;G03F1/84;H01L21/027;H01L21/30;H01L21/66;H01L21/68 主分类号 G01N21/88
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