| 摘要 |
Device for separating sliding electrical components, such as ICs (SMDs) in particular from so-called IC stacks, in particular so as to be able to feed the components individually to a test base in a correctly positioned fashion and to be able to make contact with them there. In the device, the components slide downwards on an obliquely extending slide into the area of a fitting which is provided for testing the components according to the invention. In the area of the fitting, four levers (8, 9, 10, 11) which engage in the sliding path and influence the components in the sliding path are provided in the sliding direction at a distance which is equal to or slightly greater than the length of each individual component (6) in order to separate the components and thus feed them successively, the said levers (8, 9, 10, 11) all being actuated by a common cam drive (12) with four different cams (13, 14, 15, 16) in the direction of, and towards, the sliding path, at least the third lever (10) of which is arranged above the test base and is constructed as a probe which presses the components downwards, the first two levers and the last two levers operating successively in such a way that whenever the second or fourth lever releases a respective component, the first or third lever grips the component (6) located below it, and vice versa. The said invention is characterised by two output slides which can be optionally connected to the slide. <IMAGE>
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