发明名称 |
SEMICONDUCTOR MEMORY DEVICE |
摘要 |
The semiconductor memory device for removing the soft error comprises: a substrate of first type; a surface charge storage region and a bit line region both of second type; a first gate electrode for the charge storage region; a second gate electrode for the bit line region; insulation layers separating the regions and the gate electrodes; and two high concentration impurity regions adjacent the charge storage and bit line regions forming PN junctions with each.
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申请公布号 |
KR900002915(B1) |
申请公布日期 |
1990.05.03 |
申请号 |
KR19860008097 |
申请日期 |
1986.09.26 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
GAZUHIRO ZUGAMODO;SIMIZU MASAHIRO;INUISHI MASAHIDE;SIMANO HORIKI |
分类号 |
H01L27/10;G11C11/34;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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