发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 The semiconductor memory device for removing the soft error comprises: a substrate of first type; a surface charge storage region and a bit line region both of second type; a first gate electrode for the charge storage region; a second gate electrode for the bit line region; insulation layers separating the regions and the gate electrodes; and two high concentration impurity regions adjacent the charge storage and bit line regions forming PN junctions with each.
申请公布号 KR900002915(B1) 申请公布日期 1990.05.03
申请号 KR19860008097 申请日期 1986.09.26
申请人 MITSUBISHI ELECTRIC CORP 发明人 GAZUHIRO ZUGAMODO;SIMIZU MASAHIRO;INUISHI MASAHIDE;SIMANO HORIKI
分类号 H01L27/10;G11C11/34;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/10
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