发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
The method for manufacturing trench capacitor comprises a first process for forming oxidized layer (11) and a trench on a base (10), a second process for forming insulating layer (13) on side walls of the trench and for forming polysilicon layer (14) on the whole surface, a third process for forming trench (16) by etching back the poly silicon layer (14), a fourth process for filling polysilicon (17) in the trench (16), and a fifth process for etching back the polysilicon (17) for smoothing the layer and for forming polysilicon electrode (18).
|
申请公布号 |
KR900003262(B1) |
申请公布日期 |
1990.05.12 |
申请号 |
KR19870004242 |
申请日期 |
1987.04.30 |
申请人 |
SAM SUNG ELECTRONICS CO LTD |
发明人 |
SONG JU-HO;HAN DAE-HUI;KANG KUNG-WON |
分类号 |
H01L27/04;H01L21/3065;H01L21/3213;H01L21/334;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;H01L29/94;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|