发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 The method for manufacturing trench capacitor comprises a first process for forming oxidized layer (11) and a trench on a base (10), a second process for forming insulating layer (13) on side walls of the trench and for forming polysilicon layer (14) on the whole surface, a third process for forming trench (16) by etching back the poly silicon layer (14), a fourth process for filling polysilicon (17) in the trench (16), and a fifth process for etching back the polysilicon (17) for smoothing the layer and for forming polysilicon electrode (18).
申请公布号 KR900003262(B1) 申请公布日期 1990.05.12
申请号 KR19870004242 申请日期 1987.04.30
申请人 SAM SUNG ELECTRONICS CO LTD 发明人 SONG JU-HO;HAN DAE-HUI;KANG KUNG-WON
分类号 H01L27/04;H01L21/3065;H01L21/3213;H01L21/334;H01L21/822;H01L21/8242;H01L27/10;H01L27/108;H01L29/94;(IPC1-7):H01L27/108 主分类号 H01L27/04
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