| 摘要 |
A semiconductor integrated circuit includes transfer gates to separate a plurality of functional devices and an input or output buffer circuit, and a test circuit to connect the input buffer circuit and the output buffer circuit directly, when input, output, and input and output characteristics of the input buffer circuit and the output buffer circuit are tested. Therefore, only one test pattern is used, so that the characteristics of the buffer circuits are tested easily in a short time and exactly. |
