Process for producing a synthesized reference image for the inspection of objects and apparatus for performing the same

摘要

The process consists of producing a first binary image (104) from descriptive data of an integrated circuit (or another type of object) to be inspected, the data being stored in a data base (102). Real images of characteristic elements of the integrated circuit to be inspected are then acquired (200) and processed so as to be applicable (300) to the binary image, as a function of their associated positions. A this obtained synthesis image is considered as a reference image with which are compared the images of the circuits to be inspected. This process is applicable to numerous types of industrially produced objects requiring a very precise inspection.