发明名称 Photoionization mass spectroscopy flux monitor
摘要 The present invention provides a photoionization mass spectroscopy flux monitor for gaseous species above a sample surface. It provides an in situ, real time, species specific, nonintrusive probe with a geometry compatible with conventional MBE growth chambers. Gaseous species are photoionized above a sample surface and the ionized gaseous species are extracted parallel to the sample surface and coupled into a mass spectrometer inlet adjacent to the sample surface. The geometry of the flux monitor allows for simultaneous coupling of a charged particle beam with the sample surface, for example for monitoring film growth with RHEED.
申请公布号 US5397895(A) 申请公布日期 1995.03.14
申请号 US19930019854 申请日期 1993.02.19
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF COMMERCE 发明人 LEONE, STEPHEN R.;STRUPPP PAUL G.;SMILGYS, RUSSELL V.;ALSTRIN, APRIL L.
分类号 C30B23/02;H01J49/06;H01J49/16;(IPC1-7):B01D59/44;H01J49/00 主分类号 C30B23/02
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