发明名称 Maintaining uniformity of deposited film thickness in plasma-enhanced chemical vapor deposition
摘要 In depositing films upon a plate by use of plasma-enhanced chemical vapor deposition, variations in thickness of the film that normally occur at the edges of the plate are reduced by positioning a frame of tiles around the plate. The frame provides a sacrificial edge at which thickness variations at the edge of the film can occur. After deposition, removal of the frame results in improved uniformity of film thickness on the plate itself.
申请公布号 US5490881(A) 申请公布日期 1996.02.13
申请号 US19920970201 申请日期 1992.11.02
申请人 KWASNICK, ROBERT F. 发明人 KWASNICK, ROBERT F.
分类号 C23C16/44;C23C16/458;C23C16/50;(IPC1-7):C23C16/50 主分类号 C23C16/44
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