发明名称 Method and apparatus for measuring incident radiation
摘要 A method and apparatus for measuring radiation are disclosed in which a scintillation body intercepts incident radiation to cause the body to emit a population of scintillation photons, the population of scintillation photons is spectrally decomposed into at least a first subpopulation of photons and a second subpopulation of photons (the first subpopulation originating from faster time decay processes than the second subpopulation) and at least one of the subpopulations is detected.
申请公布号 US5493121(A) 申请公布日期 1996.02.20
申请号 US19920983790 申请日期 1992.11.30
申请人 OPTICAL SEMICONDUCTORS, INC. 发明人 FITZPATRICK, BRIAN J.
分类号 G01T1/17;G01T1/20;(IPC1-7):G01T1/20 主分类号 G01T1/17
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