发明名称 |
Method and apparatus for measuring incident radiation |
摘要 |
A method and apparatus for measuring radiation are disclosed in which a scintillation body intercepts incident radiation to cause the body to emit a population of scintillation photons, the population of scintillation photons is spectrally decomposed into at least a first subpopulation of photons and a second subpopulation of photons (the first subpopulation originating from faster time decay processes than the second subpopulation) and at least one of the subpopulations is detected.
|
申请公布号 |
US5493121(A) |
申请公布日期 |
1996.02.20 |
申请号 |
US19920983790 |
申请日期 |
1992.11.30 |
申请人 |
OPTICAL SEMICONDUCTORS, INC. |
发明人 |
FITZPATRICK, BRIAN J. |
分类号 |
G01T1/17;G01T1/20;(IPC1-7):G01T1/20 |
主分类号 |
G01T1/17 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|