发明名称 Chemisch-mechanische Poliervorrichtung für Halbleiterwafer
摘要 A chemical mechanical polishing apparatus for a semiconductor wafer which is capable of polishing uniformly the surface of the semiconductor wafer and of controlling the polishing amount by providing plurality of rotary drums each wrapped in a polishing cloth on the upper surface of a polishing pad and connecting supporters capable of vertical movement to both ends each rotary drum, and includes a rotatable polishing pad in the planar upper surface of which a plurality of recesses are formed for receiving a semiconductor wafer, a plurality of rotatable polishing units located on the polishing pad for planarizing the surface of the semiconductor wafers, a supporter connected at the endpoints of the rotational polishing units which can make a vertical movement, and a slurry applicator located above the rotational polishing units for putting a slurry thereon.
申请公布号 DE19648066(A1) 申请公布日期 1998.01.22
申请号 DE1996148066 申请日期 1996.11.20
申请人 LG SEMICON CO., LTD., CHEONGJU, KR 发明人 KIM, YOUNG-KWON, CHEONGJU, KR;JUN, YOUNG-KWON, SEOUL/SOUL, KR
分类号 B24B37/00;B24B37/04;B24B37/10;B24B37/20;B24B37/24;B24B41/04;H01L21/304;(IPC1-7):H01L21/302 主分类号 B24B37/00
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