| 摘要 |
PURPOSE: A method of managing a test history in production process of an electronic device is described, which can improve effectiveness of production process. CONSTITUTION: A measuring instrument is coupled to a fabricated set whenever a test-required process is completed during fabrication of an electronic device to perform necessary tests. After completion of the tests, test result data are stored in an electrically readable/erasable non-volatile memory mounted in the fabricated set. If final test result of the fabricated set is eligible, all of the data stored therein are reset. Therefore, effectiveness of production process can be improved.
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