发明名称 NEEDLE-SHAPED CONTACT PROBE
摘要 PROBLEM TO BE SOLVED: To provide a needle-shaped contact probe capable of performing stable measurement over a long period in measuring the internal resistance of a flat plate contact on the order of mΩ. SOLUTION: In a needle-shaped contact probe which comprises at least two needle-shaped protrusions 1 and 2 at a tip of a rod member 3, the distances (heights (La and Lb)) from any horizontal plane 4 which intersects the rod member 3 with the axis 3a of the rod member 3 as a vertical line to the tips 1a and 2a are different for every protrusions. It is preferable to arrange the needle-shaped protrusions helically at the tip of the rod member 3.
申请公布号 JP2000329789(A) 申请公布日期 2000.11.30
申请号 JP19990319672 申请日期 1999.11.10
申请人 SONY CHEM CORP 发明人 KOUCHI YUJI;FURUTA KAZUTAKA
分类号 G01R1/067;G01R27/02;(IPC1-7):G01R1/067 主分类号 G01R1/067
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