发明名称 |
NEEDLE-SHAPED CONTACT PROBE |
摘要 |
PROBLEM TO BE SOLVED: To provide a needle-shaped contact probe capable of performing stable measurement over a long period in measuring the internal resistance of a flat plate contact on the order of mΩ. SOLUTION: In a needle-shaped contact probe which comprises at least two needle-shaped protrusions 1 and 2 at a tip of a rod member 3, the distances (heights (La and Lb)) from any horizontal plane 4 which intersects the rod member 3 with the axis 3a of the rod member 3 as a vertical line to the tips 1a and 2a are different for every protrusions. It is preferable to arrange the needle-shaped protrusions helically at the tip of the rod member 3.
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申请公布号 |
JP2000329789(A) |
申请公布日期 |
2000.11.30 |
申请号 |
JP19990319672 |
申请日期 |
1999.11.10 |
申请人 |
SONY CHEM CORP |
发明人 |
KOUCHI YUJI;FURUTA KAZUTAKA |
分类号 |
G01R1/067;G01R27/02;(IPC1-7):G01R1/067 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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