| 摘要 |
PROBLEM TO BE SOLVED: To reduce costs necessary for inspecting a pixel part of a p- SiTFT-LCD and driver circuits. SOLUTION: A test circuit 11 is formed, comprising a test pattern generation part 6 which is connected with at least either the pixel part 3 or the driver circuit part 4 formed on an LCD substrate 1 and generates a test pattern for inspecting an electric response of the pixel part 3 or the driver circuit part 4, an expected value data output part 9 for outputting an expected value data expected as a normal response of the pixel part 3 or the driver circuit part 4, and a data comparison part for comparing the output data from the pixel part 3 or the driver circuit part 4 with the expected value data outputted from the expected data value output part 9 and outputting the data concerning the present or absence of electric failure of the pixel part 3 or the driver circuit part 4.
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