发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To stabilize the threshold voltage, and to increase the speed without deteriorating integration even if an SOI substrate is used. SOLUTION: An interval Ds between the source/drain impurity layer 7 and the sapphire substrate 1 is set to approximately 0.1 to 0.2μm.
申请公布号 JP2003069033(A) 申请公布日期 2003.03.07
申请号 JP20010260432 申请日期 2001.08.29
申请人 ASAHI KASEI MICROSYSTEMS KK 发明人 KOBAYASHI TAKAAKI
分类号 H01L27/12;H01L29/786;(IPC1-7):H01L29/786 主分类号 H01L27/12
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