发明名称 |
Multiple local probe measuring device and method |
摘要 |
A local probe measuring device is provided for effecting local measurements of a sample. This device includes first and second local probes for local measurements with respect to a sample or a reference surface. A measurement condition adjustment arrangement is adapted to commonly adjust first and second measurement conditions of the respective first and second local probes with respect to the sample or the reference surface. A detection arrangement is provided that includes first and second detection arrangements associated with the respective first and second local probes and adapted to independently detect first and second measurement data referring to local measurements effected by the respective first and second local probes.
|
申请公布号 |
US6545492(B1) |
申请公布日期 |
2003.04.08 |
申请号 |
US19990399961 |
申请日期 |
1999.09.20 |
申请人 |
EUROPAISCHES LABORATORIUM FUR MOLEKULARBIOLOGIE (EMBL) |
发明人 |
ALTMANN STEPHAN MAXIMILIAN;HOERBER JOHANN KARL HEINRICH |
分类号 |
G01Q20/02;G01Q70/00;(IPC1-7):G01R31/02 |
主分类号 |
G01Q20/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|