| 摘要 |
A method for the testing of electronic components, proposing an optimization of a duration for the tests of this method, includes the step of choosing an earliest possible measurement date (Dm) with respect to an initial testing date (Do). According to this method, this earliest possible measurement date is chosen by considering statistical images (IS) obtained on a population of components (P1, P2) and by comparing these statistical images with one another by means of a criterion. This criterion takes into account a mean and a range of the responses given by the test population during iterations of a same test with different measurement dates.
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