发明名称 |
Systems and methods for determining a seam |
摘要 |
A method performed by an electronic device is described. The method includes determining overlapping areas from neighboring images. The method also includes determining a difference measure between the overlapping areas. The method further includes determining a constraint measure corresponding to at least one of the overlapping areas. The method additionally includes determining a seam based on a combination of the difference measure and the constraint measure. |
申请公布号 |
US9563953(B2) |
申请公布日期 |
2017.02.07 |
申请号 |
US201514811489 |
申请日期 |
2015.07.28 |
申请人 |
QUALCOMM Incorporated |
发明人 |
Xu Lei;Pan Yunke;Quan Shuxue;Xiong Yingen;Bi Ning |
分类号 |
G06T7/00;G06T3/40;H04N5/232;G06T5/50;G06T7/20 |
主分类号 |
G06T7/00 |
代理机构 |
Austin Rapp & Hardman |
代理人 |
Austin Rapp & Hardman |
主权项 |
1. A method performed by an electronic device, comprising:
determining overlapping areas from neighboring images; determining a difference measure between the overlapping areas; determining a constraint measure corresponding to at least one of the overlapping areas; and determining a seam based on a combination of the difference measure and the constraint measure, wherein the seam in the overlapping areas is found by determining a cumulative energy level of a current pixel and by determining a minimum cumulative energy level of four neighboring pixels and adding the minimum cumulative energy level to an energy level of the current pixel. |
地址 |
San Diego CA US |