发明名称 Systems and methods for determining a seam
摘要 A method performed by an electronic device is described. The method includes determining overlapping areas from neighboring images. The method also includes determining a difference measure between the overlapping areas. The method further includes determining a constraint measure corresponding to at least one of the overlapping areas. The method additionally includes determining a seam based on a combination of the difference measure and the constraint measure.
申请公布号 US9563953(B2) 申请公布日期 2017.02.07
申请号 US201514811489 申请日期 2015.07.28
申请人 QUALCOMM Incorporated 发明人 Xu Lei;Pan Yunke;Quan Shuxue;Xiong Yingen;Bi Ning
分类号 G06T7/00;G06T3/40;H04N5/232;G06T5/50;G06T7/20 主分类号 G06T7/00
代理机构 Austin Rapp & Hardman 代理人 Austin Rapp & Hardman
主权项 1. A method performed by an electronic device, comprising: determining overlapping areas from neighboring images; determining a difference measure between the overlapping areas; determining a constraint measure corresponding to at least one of the overlapping areas; and determining a seam based on a combination of the difference measure and the constraint measure, wherein the seam in the overlapping areas is found by determining a cumulative energy level of a current pixel and by determining a minimum cumulative energy level of four neighboring pixels and adding the minimum cumulative energy level to an energy level of the current pixel.
地址 San Diego CA US