发明名称 Method for detecting alignment film and device for the same
摘要 A method for detecting an alignment film coated on a substrate of a liquid crystal panel comprises: obtaining an image of an alignment film test region of a substrate; and analyzing continuity of the alignment film along an internal boundary of the alignment film test region in the image obtained. since the alignment film test region is located outside an active display area of the substrate, when the alignment film along the internal boundary of the alignment film test region is determined as continuous, it can be determined that all the edges of the alignment film are outside the active display area, then a Haro region which might appear on the edge of the alignment film may also be located outside the active display area, so as to ensure uniform thickness of the alignment film in the active display area of the substrate.
申请公布号 US9595093(B2) 申请公布日期 2017.03.14
申请号 US201314132634 申请日期 2013.12.18
申请人 BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD. 发明人 Lin Haiyun;Zhao Qinghui;Zhao Chengtan
分类号 G06K9/00;G06T7/00 主分类号 G06K9/00
代理机构 Ladas & Parry LLP 代理人 Ladas & Parry LLP
主权项 1. A method for detecting alignment film coated on a substrate of a liquid crystal panel, comprising: obtaining an image of an alignment film test region of the substrate, wherein, the alignment film test region is an annular region with edges of an active display area of the substrate as an internal boundary of the alignment film test region; and analyzing continuity of the alignment film along the internal boundary of the alignment film test region in the image obtained so as to determine whether thickness of the alignment film in the active display area of the substrate is uniform; wherein if the alignment film along the internal boundary of the alignment film test region in the image has no breakpoint, the alignment film along the internal boundary of the alignment film test region in the image is determined as continuous and the thickness of the alignment film in the active display area of the substrate is determined as uniform, and wherein the no breakpoint indicates that the active display area of the substrate is coated entirely by the alignment film.
地址 Beijing CN