发明名称 System and method for estimating seismic anisotropy with high resolution
摘要 A system and method for estimating seismic anisotropy of subsurface formations with high resolution. A method for determining anisotropy parameters of subsurface formations includes generating a synthetic reflectivity gather from a vertical well log. Times of a surface seismic gather are adjusted to those of the synthetic gather. Low-cut filtering is applied to the surface seismic gather. Anisotropy parameters are generated as a difference of the filtered seismic gather and the synthetic gather. An anisotropy value is assigned to each of plurality of layers of a formation based on the generated anisotropy parameters.
申请公布号 US9488744(B2) 申请公布日期 2016.11.08
申请号 US201414476315 申请日期 2014.09.03
申请人 UNIVERSITY OF HOUSTON SYSTEM 发明人 Thomsen Leon;Lin Rongrong
分类号 G01V1/28;G01V1/36;G01V1/30 主分类号 G01V1/28
代理机构 Conley Rose, P.C. 代理人 Conley Rose, P.C.
主权项 1. A method for determining anisotropy parameters of subsurface formations, comprising: generating a synthetic reflectivity gather from a vertical well log; adjusting times of a surface seismic gather to those of the synthetic gather; low-cut filtering the surface seismic gather; generating anisotropy parameters as a difference of the filtered seismic gather and the synthetic gather; and assigning an anisotropy value to each of a plurality of layers of a formation based on the generated anisotropy parameters.
地址 Houston TX US