发明名称 |
System and method for estimating seismic anisotropy with high resolution |
摘要 |
A system and method for estimating seismic anisotropy of subsurface formations with high resolution. A method for determining anisotropy parameters of subsurface formations includes generating a synthetic reflectivity gather from a vertical well log. Times of a surface seismic gather are adjusted to those of the synthetic gather. Low-cut filtering is applied to the surface seismic gather. Anisotropy parameters are generated as a difference of the filtered seismic gather and the synthetic gather. An anisotropy value is assigned to each of plurality of layers of a formation based on the generated anisotropy parameters. |
申请公布号 |
US9488744(B2) |
申请公布日期 |
2016.11.08 |
申请号 |
US201414476315 |
申请日期 |
2014.09.03 |
申请人 |
UNIVERSITY OF HOUSTON SYSTEM |
发明人 |
Thomsen Leon;Lin Rongrong |
分类号 |
G01V1/28;G01V1/36;G01V1/30 |
主分类号 |
G01V1/28 |
代理机构 |
Conley Rose, P.C. |
代理人 |
Conley Rose, P.C. |
主权项 |
1. A method for determining anisotropy parameters of subsurface formations, comprising:
generating a synthetic reflectivity gather from a vertical well log; adjusting times of a surface seismic gather to those of the synthetic gather; low-cut filtering the surface seismic gather; generating anisotropy parameters as a difference of the filtered seismic gather and the synthetic gather; and assigning an anisotropy value to each of a plurality of layers of a formation based on the generated anisotropy parameters. |
地址 |
Houston TX US |