发明名称 Spectral imaging system and method
摘要 Spectral x-ray imaging using a photon counting x-ray detector (PCXD) transmits a broad spectrum x-ray beam through an object, detects the transmitted x-ray beam with the PCXD and processes the detected signals to determine material characteristics of the object using both the detected signals as a function of detector layer and the detected signals as a function of the particular energy band. Each detector layer of the multiple detector layers produces at least two signals, each signal representing a detected x-ray intensity in a particular energy band, and the depth information contained in the separate read-out channels.
申请公布号 US9488739(B2) 申请公布日期 2016.11.08
申请号 US201414574103 申请日期 2014.12.17
申请人 The Board of Trustees of the Leland Stanford Junior University 发明人 Pelc Norbert J.
分类号 G01N23/00;G01T1/24;G01N23/04;A61B6/00;A61B6/03 主分类号 G01N23/00
代理机构 Lumen Patent Firm 代理人 Lumen Patent Firm
主权项 1. A method for spectral x-ray measurement using a photon counting x-ray detector (PCXD), the method comprising: transmitting from an x-ray source a broad spectrum x-ray beam through an object; detecting the transmitted x-ray beam with the photon counting x-ray detector (PCXD) to produce detected signals, wherein the detecting uses multiple detector layers in the PCXD to produce the detected signals such that each detector layer of the multiple detector layers produces at least two signals, each signal representing a detected x-ray intensity in a particular energy band; processing with a computer the detected signals to produce a value representative of material characteristics of the object, wherein the processing uses both the detected signals as a function of detector layer and the detected signals as a function of the particular energy band.
地址 Palo Alto CA US