| 摘要 |
PURPOSE:To improve the testing accuracy drastically by effectively correcting errors due to a test current fed to perform a dynamic testing of a circuit to be measured. CONSTITUTION:A voltage detection circuit is composed of an adjustment circuit 12, a comparator circuit 14, a decision level generation circuit 16, an attenuator 18, a buffer 20 and the like. The decision level generation circuit 16 comprises a D/A converter and the like and generates a decision level Vs as reference for comparison of the comparator circuit 14. The adjustment circuit 12 performs a so-called zero-adjustment. As a test current I flows to a circuit 10 to be measured from a terminal P1 to be measured and the ground G1, a voltage developing between the terminal P1 being measured and the ground G1 while the current I is flowing is fed to the comparison circuit 14 as comparison input via the buffer 20 and the attenuator 18. The comparator circuit 14 compares the comparison input level based on said decision level Vs. A correction circuit 24 is so arranged to perform a correcting operation using the dicision level Vs as input to be corrected.
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