发明名称 METHOD FOR FORMING SPACERS FOR A TRANSISTOR GATE
摘要 A method for forming spacers of a gate of a transistor is provided, including forming a protective layer covering the gate; after the forming the protective layer, at least one step of forming a carbon film on the transistor; removing portions of the carbon film located on a top and on either side of the gate; modifying the protective layer on the top of the gate and on either side of the gate; and removing the modified protective layer.
申请公布号 US2016372331(A1) 申请公布日期 2016.12.22
申请号 US201615185281 申请日期 2016.06.17
申请人 Commissariat A L'Energie Atomique et aux Energies Alternatives 发明人 POSSEME Nicolas
分类号 H01L21/28;H01L29/49;H01L29/06;H01L29/66;H01L29/78 主分类号 H01L21/28
代理机构 代理人
主权项
地址 Paris FR