发明名称 |
METHOD FOR FORMING SPACERS FOR A TRANSISTOR GATE |
摘要 |
A method for forming spacers of a gate of a transistor is provided, including forming a protective layer covering the gate; after the forming the protective layer, at least one step of forming a carbon film on the transistor; removing portions of the carbon film located on a top and on either side of the gate; modifying the protective layer on the top of the gate and on either side of the gate; and removing the modified protective layer. |
申请公布号 |
US2016372331(A1) |
申请公布日期 |
2016.12.22 |
申请号 |
US201615185281 |
申请日期 |
2016.06.17 |
申请人 |
Commissariat A L'Energie Atomique et aux Energies Alternatives |
发明人 |
POSSEME Nicolas |
分类号 |
H01L21/28;H01L29/49;H01L29/06;H01L29/66;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
Paris FR |