Semiconductor memory device with a self-testing function.

摘要

A semiconductor memory device comprises a self-test circuit (17, 18, 19, 20). The self-test circuit starts to operate in response to a control signal. The self-test circuit controls the operation of data writing and data reading so that data are written into the memory cells in the memory cell array and read out the data from the memory cells. The self-test circuit checks whether or not an error is contained in the read data by comparing the read data with the write data.