发明名称 RESIST FILM THICKNESS INSPECTING INSTRUMENT
摘要 PURPOSE:To store and analyze data by digitizing and storing a measured value. CONSTITUTION:A turntable 1 is rotated by a turntable rotary driving part 2 and its one-turn angle is divided equally by an encoder 3 to generate a rotational angle signal (a). Then an optical system 8 is fixed to a stage 4, which is removed by a stage driving part 5 in a radial direction of the table 1. Further, a position detector 6 detects the distance from the center of the table 1 to the stage 4 and generates a position signal (b). A laser 7 emits a laser beam (c), which is split into two by the optical system 8. One beam is guided to and reflected by a body to be measured on the table 1 to become a reflected beam (e) and the other beam becomes an incident beam (d) for detecting the quantity of the beam (c), so that those beams are supplied to photodetectors 9 and 10, thereby generating incidence and reflection signals (f) and (g). The reflection factor signal (h) generated by dividing 11 the signal (g) by the signal (f) is A/D-converted 12 and stored 13 and the measurement result is displayed out 16.
申请公布号 JPS63159703(A) 申请公布日期 1988.07.02
申请号 JP19860314901 申请日期 1986.12.23
申请人 NEC CORP 发明人 TANEHASHI MASAO
分类号 G01B11/06;G11B7/26;G11B20/18 主分类号 G01B11/06
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