发明名称 CUTTING OFF METHOD OF SEMICONDUCTOR WAFER
摘要 <p>PURPOSE:To minimize the pollution of semiconductor wafer by a method wherein a water reservoir is formed on the semiconductor wafer for reducing the cut-off scraps bonded onto the semiconductor wafer. CONSTITUTION:An adhesive sheet 2 bonded onto a semiconductor wafer 1 is fixed to a flat ring 6. Next, after fixing the rear surface of the semiconductor wafer 1 on a wafer adsorption base 7, the flat ring 6 is fixed to the part above the surface of the semiconductor wafer 1. Finally, the semiconductor wafer 1 in such a state is cut off using a cutting-off blade 3.</p>
申请公布号 JPH04278563(A) 申请公布日期 1992.10.05
申请号 JP19910041490 申请日期 1991.03.07
申请人 NEC YAMAGUCHI LTD 发明人 AKIMOTO YOSHIYUKI
分类号 H01L21/301;H01L21/78 主分类号 H01L21/301
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