| 摘要 |
The vision test error preventing circuit for semiconductor marking process is characterized in that an error preventing circuit is placed between a sensor and a vision system, and the error preventing circuit has a counter for making the sensor output a sensing signal pulse every other time, a reset unit for supplying a reset signal to the counter, a multivibrator for generating a pulse according to a marking machine control signal and supplying the reset signal to the reset unit, a vision system driving unit for resetting the counter and switching on the vision system, an AND gate for receiving the output of the counter and the inverted marking machine control signal; and a vision signal supplying unit for supplying the output of the AND gate or vision system driving unit and inverting supplying it as a vision system driving signal.
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