发明名称 CAPACITOR MANUFACTURE METHOD OF SEMICONDUCTOR DRAM CELL
摘要 classifying a field region and an active region on a semiconductor substrate(51) to define a region(57) to form a capacitor node to grow a thick oxide film(58) on the region(57); forming a gate electrode and a source/drain region to deposit an insulating oxide film to open the region(57) to form the capacitor node and wet-etching of the oxide neighboring on the thick oxide(58) film; depositing a polysilicon to form a node electrode of the capacitor to form the node electrode(70) by etching the node polysilicon; and forming a dielectric film and a plate electrode of the capacitor on the surface of the node electrode(70).
申请公布号 KR960016247(B1) 申请公布日期 1996.12.07
申请号 KR19930000010 申请日期 1993.01.04
申请人 LG SEMICONDUCTOR CO.,LTD. 发明人 PARK, NAM-KYU
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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