发明名称 |
CAPACITOR MANUFACTURE METHOD OF SEMICONDUCTOR DRAM CELL |
摘要 |
classifying a field region and an active region on a semiconductor substrate(51) to define a region(57) to form a capacitor node to grow a thick oxide film(58) on the region(57); forming a gate electrode and a source/drain region to deposit an insulating oxide film to open the region(57) to form the capacitor node and wet-etching of the oxide neighboring on the thick oxide(58) film; depositing a polysilicon to form a node electrode of the capacitor to form the node electrode(70) by etching the node polysilicon; and forming a dielectric film and a plate electrode of the capacitor on the surface of the node electrode(70).
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申请公布号 |
KR960016247(B1) |
申请公布日期 |
1996.12.07 |
申请号 |
KR19930000010 |
申请日期 |
1993.01.04 |
申请人 |
LG SEMICONDUCTOR CO.,LTD. |
发明人 |
PARK, NAM-KYU |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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