发明名称 Heated circuit assembly tester and method
摘要 An apparatus and method provides a testing process and a machine for implementing a testing process to produce failures on a heated circuit card. The apparatus and method applies a controlled, repeatable shear stress to the joints between a circuit board and its mounted components. The circuit board is heated, and one end is twisted with respect to a second end to produce stresses within the circuit board simulating those imposed on components due to thermal cycling. The apparatus may be computer controlled, for regulating the twisting of the circuit board to produce a precise twist angle during a cyclic twisting of the heated circuit board. Electrical resistance of critical joints may be monitored during the testing, and a data base compiled identifying the cycle count at which a failure occurs and location of the failure on the circuit board.
申请公布号 US5838568(A) 申请公布日期 1998.11.17
申请号 US19960672882 申请日期 1996.06.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DICKINSON, GERARD TRUMAN;MCGINNISS, JR., JAMES LEE;TOKARZ, RONALD F.;ZUBELEWICZ, ALEKSANDER
分类号 G01R31/28;G01R31/30;(IPC1-7):G06F19/00 主分类号 G01R31/28
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