发明名称 SRAM with high speed read/write operation
摘要 A semiconductor memory device comprises full-CMOS type memory cell which device can shorten read time and write time of storage information. The memory cell thereof comprises one pair of load transistors, one pair of driving transistors, and one pair of transferring transistors which pair of transistors constitute a flip-flop circuit respectively. In the memory cell, a first pair-of-bit-lines is connected to source/drain side of the pair of transferring transistors, while a second pair-of-bit-lines is connected to source side of the pair of driving transistors. At the read time, signal from the four bit lines is inputted to a sense amplifier, while at the write time, a complementary signal based on write information is applied to both of the first pair-of-bit-lines and the second pair-of-bit-lines from a write buffer.
申请公布号 US5898611(A) 申请公布日期 1999.04.27
申请号 US19970940252 申请日期 1997.09.30
申请人 NEC CORPORATION 发明人 YAMADA, TAKASHI
分类号 G11C11/412;G11C11/417;G11C11/419;H01L21/8244;H01L27/11;(IPC1-7):G11C11/00 主分类号 G11C11/412
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