发明名称 |
Electrostatic discharge protection circuit |
摘要 |
A semiconductor memory device conserves chip area by jointly connecting transistors which are respectively connected to pads adjacent to each other. The device includes first and second electrostatic discharge protection MOSFET transistors which have drains respectively connected to pads adjacent to each other and which define a first active area. A common source is arranged between the first and second transistors areas and defines a second active area in common to both transistors. The device is connected to a single power supply at the gates and sources thereof. The transistors also share common active ground lines.
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申请公布号 |
US5962899(A) |
申请公布日期 |
1999.10.05 |
申请号 |
US19960628388 |
申请日期 |
1996.04.05 |
申请人 |
SAMSUNG ELECTRONICS, CO., LTD. |
发明人 |
YANG, HYANG-JA;PARK, HEE-CHUL |
分类号 |
H01L27/04;G11C7/04;H01L21/822;H01L21/8242;H01L27/02;H01L27/108;H01L27/118;(IPC1-7):H01L23/60;H01L27/092 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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