发明名称 CONTACT PROBE SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a contact probe system including a capability remodeled so as to resist excessive displacement.SOLUTION: A contact probe includes a stylus 301, a sensor, and two parallel substantially planar plates. The stylus 301 has a contact. The sensor has a substantially planar shape and includes a fixed part 302a, at least three thin-walled parts each formed of a planar plate and having a strain sensor vapor-deposited thereon, and a movable part 340 mounted with the stylus 301 and linked to the fixed part 302a via the thin-walled parts in at least three locations. The two parallel substantially planar plates are connected to both sides of the movable part and sandwich the movable port therebetween so as to maintain a predetermined distance between the movable part and the two parallel substantially planar plates and limit movement of the movable part to a movable range. The sensor outputs a contact signal due to the strain sensors deforming in response to a measurement force from the stylus 301.SELECTED DRAWING: Figure 3a
申请公布号 JP2016194503(A) 申请公布日期 2016.11.17
申请号 JP20150247186 申请日期 2015.12.18
申请人 MITSUTOYO CORP 发明人 EDWIN BOS;ERNST TREFFERS;HIDAKA KAZUHIKO
分类号 G01B5/012 主分类号 G01B5/012
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