发明名称 HOLDING DEVICE, CONVEYING DEVICE, IC INSPECTION DEVICE, HOLDING METHOD, CONVEYING METHOD AND IC INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a holding device, a conveying device, an IC inspection device, a holding method, a conveying method and an IC inspection method allowing having a held component assuredly followed to an object position when the component is removed and contained. SOLUTION: A hand part 50 adapted to hold the component comprises a compliance mechanism 23 formed with a spring and an elastic body allowing having the held component followed to a face in a predetermined position.
申请公布号 JP2002160187(A) 申请公布日期 2002.06.04
申请号 JP20000356877 申请日期 2000.11.24
申请人 SEIKO EPSON CORP 发明人 YAMAUCHI OSAMI
分类号 G01R31/26;B25J15/06;B25J17/02;G01R31/28;(IPC1-7):B25J15/06 主分类号 G01R31/26
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