发明名称 ION SOURCE AND MASS SPECTROSCOPE
摘要 PROBLEM TO BE SOLVED: To make liquid-drop density that is taken into the mass spectroscope a correct value and reduce the noise in the sonic spray ion source and mass spectroscope. SOLUTION: The solution sample in the sample solution introduction part 1 is introduced into a capillary 2. The capillary 2 is installed in the ion source 6. The gas that is supplied from a gas supply part 4 is introduced into the ion source 6 by a gas tube 5 and flown along the outer circumference of the capillary 2 and discharged from the orifice 3 into the air. The gas flow touches the dispersing member 7 and is dispersed. The fine liquid-drops or ion that are generated in the air pass through a hole 8 of the dispersing member 7 and are taken into the mass spectrometer 11 from a thin hole 10 and analyzed for mass spectrometric analysis. Even in the cases where the flow rate of the sample solution is higher than the conventional sonic spray ion source and mass spectroscope, this can be used. By auto-tuning, the adjustment work of the user is reduced.
申请公布号 JP2002184346(A) 申请公布日期 2002.06.28
申请号 JP20010310865 申请日期 2001.10.09
申请人 HITACHI LTD 发明人 HIRABAYASHI YUKIKO;NABESHIMA TAKAYUKI;TAKADA YASUAKI;SAKAIRI MINORU;KOIZUMI HIDEAKI
分类号 G01N27/62;G01N1/28;G01N30/72;H01J49/04;H01J49/10;(IPC1-7):H01J49/10 主分类号 G01N27/62
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