发明名称 Method of improving adhesion of cap oxide to nanoporous silica for integrated circuit fabrication
摘要 A method of improving adhesion of a cap oxide to nanoporous silica for integrated circuit fabrication. In one embodiment, the method comprises several steps. The first step is to receive a wafer in a deposition chamber. Then a porous layer of material is deposited on the wafer. Next, a portion of the porous layer is densified in order to make it more compatible for adhesion to a cap layer. Finally, a cap layer is deposited onto the porous layer.
申请公布号 US6418875(B1) 申请公布日期 2002.07.16
申请号 US20010902062 申请日期 2001.07.09
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 ANNAPRAGADA RAO VENKATESWARA
分类号 H01L21/316;H01L21/3205;H01L21/768;(IPC1-7):C23C16/00;H01L21/31;H01L21/469 主分类号 H01L21/316
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