发明名称 Method for forming insulating thin films
摘要 To provide a method for forming insulating thin films that can induce condensation of silanol and dehydration to a high degree at or near ambient pressure.An interlevel dielectric layer is formed on a semiconductor substrate by coating hydrogen silsesquioxane resin onto the substrate and curing the hydrogen silsesquioxane resin to produce an interlevel dielectric layer. This interlevel dielectric layer is then heated at a pressure from 1 to 1,000 torr at a temperature from 150 to 550° C.
申请公布号 US6448175(B1) 申请公布日期 2002.09.10
申请号 US20000656728 申请日期 2000.09.07
申请人 DOW CORNING TORAY SILICONE CO., LTD. 发明人 KOBAYASHI AKIHIKO;MINE KATSUTOSHI;NAKAMURA TAKASHI;SASAKI MOTOSHI;SAWA KIYOTAKA
分类号 H01L21/316;(IPC1-7):H01L21/476 主分类号 H01L21/316
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