发明名称 CONTACT PROBE
摘要 PROBLEM TO BE SOLVED: To provide a contact probe capable of overcoming deterioration of sliding performance of a probe due to adhesion of flux. SOLUTION: A probe 14 stored in a sleeve 12 of a contact probe 10 is capable of sliding in the axial direction, and energized by a spring 16 disposed at the rear end part 12A of the sleeve 12. The body part 18 of the probe 14 is provided with an annular projecting part 26 near the forward end part 12B of the sleeve 12, whose outer peripheral surface 26A is brought into sliding contact with the inner peripheral surface of the sleeve 12. The outer peripheral surface 26A is provided with a recessed groove part 28 along the axial direction of the body part 18. When the tip 24 of the probe 14 is pressed to a portion to be examined, the probe 14 slides, and flux 30 adhering to the vicinity of the forward end part 12B of the sleeve 12 enters the recessed groove part 28 of the projecting part 26 so that the sliding performance of the probe 14 can be kept good.
申请公布号 JP2002323515(A) 申请公布日期 2002.11.08
申请号 JP20010127981 申请日期 2001.04.25
申请人 FUJI PHOTO FILM CO LTD 发明人 OTAKA HIROYUKI
分类号 G01R1/067;G01R31/02;H05K3/00;(IPC1-7):G01R1/067 主分类号 G01R1/067
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