发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which makes it possible to measure temperature without using a temperature-sensitive diode.SOLUTION: A semiconductor device comprises: an FET 14 and an IGBT 12 which are connected in parallel with each other; and an FET driver 13 which changes gate voltage of the FET 14 during the IGBT 12 is being turned on. As a result, drain current Id flowing through the FET 14 changes depending on change in gate voltage. The semiconductor device further comprises: a current detection part 16 for detecting collector current Ic of the IGBT 12 which changes inversely with change in the drain current Id of the FET 14; and an FET temperature estimation part 17 for estimating temperature of the FET 14 based on change characteristics of the drain current against the change in gate voltage.SELECTED DRAWING: Figure 1
申请公布号 JP2016225695(A) 申请公布日期 2016.12.28
申请号 JP20150107448 申请日期 2015.05.27
申请人 DENSO CORP 发明人 KAKIMOTO NORIYUKI
分类号 H03K17/08;H01L21/822;H01L27/04 主分类号 H03K17/08
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