| 摘要 |
PROBLEM TO BE SOLVED: To provide a method and a device that can accurately analyze particle shape, by inputting the outline shape of a sample particle accurately based on judgement of an operator, and by analyzing the particle shape based on the outline shape. SOLUTION: This method has a procedure for displaying a particle image of a sample on a display part 2, a procedure for inputting a correspondence relation between the number of picture elements on the particle image displayed on the display part and an actual dimension, a procedure for inputting and displaying a border line image of the optional particle in the particle image, and a procedure for computing particle image information about the particle input with the border line image to be displayed.
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