发明名称 DEVICE FOR ANALYZING SAMPLE CHIP
摘要 PROBLEM TO BE SOLVED: To provide a device and a method for analyzing a sample chip capable of improving the efficiency of an analyzing work on an assayed sample by surely and precisely detecting a fluorescence from a fluorescent material labeled to the assayed sample combined with a sample without being affected by an excitation light for the fluorescent material or a disturbing light. SOLUTION: This device is provided with a first and a second moving devices moving a sample chip holding member holding a sample chip with a plurality of samples fixed on a substrate which can guide an incident light in the longitudinal direction and in the longitudinally perpendicular direction of the sample chip respectively, a white light source, a filter member in the output side selecting a light having a wavelength exciting the fluorescent material labeled to the assayed sample reacted to the sample on the sample chip, an optical fiber bundle guiding a transmitted light to each light irradiation member, a filter member in the light reception side arranged facing to the sample chip between a pair of the light irradiation members, selectively transmitting the fluorescence from the excited fluorescent material labeled to the assayed sample reacted with the sample of the sample chip, and a light receiving unit outputting a electrical signal in accordance with the fluorescence by transmitted prescribed area. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003172701(A) 申请公布日期 2003.06.20
申请号 JP20010374432 申请日期 2001.12.07
申请人 NIPPON LASER & ELECTRONICS LAB 发明人 YONEDA HIDEKATSU;TAKASHIMA NARITSUYO
分类号 G01N21/64;G01N33/533;G01N33/536;G01N37/00;(IPC1-7):G01N21/64 主分类号 G01N21/64
代理机构 代理人
主权项
地址