发明名称 TESTER AND TESTING METHOD
摘要 Disclosed is an apparatus and method for inspection a circuit wiring on a circuit board. In advance of an actual inspection of the circuit board, image data on all of standard circuit wirings of a standard circuit board are extracted and registered as standard-shape or reference data (FIG. 14). An actual-image data obtained by actually inspecting a target circuit wiring is compared with the reference data through a least squares method (S 167) to determine the state of the target circuit wiring in accordance with a correlation value of the two data (S168). The comparison result is displayed on a display 21a while specifying a region from the reference data (S169).
申请公布号 KR20040031097(A) 申请公布日期 2004.04.09
申请号 KR20047004028 申请日期 2002.09.18
申请人 发明人
分类号 G01R31/02;G01R31/28;G01R31/312;G06T1/00;H05K3/00 主分类号 G01R31/02
代理机构 代理人
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