| 主权项 |
1. A semiconductor device comprising:
a first channel provided in a first die; and a second channel provided in a second die and disposed adjacent to the first channel, and configured to exchange signals and data with the first channel; and a ZQ control block configured to receive calibration start signals, a calibrating operation signal of another channel, a calibrating operation signal and an option signal, and output a start signal for driving a calibrating operation and a calibration period signal, wherein the first channel and the second channel receive and output calibration-related signals from and to each other through bonding, and share the calibration start signals, and wherein the calibration start signals are respectively generated in the first channel and the second channel, and wherein the ZQ control block includes a mask signal generation unit configured to receive the calibration period signal, the calibration period signal of another channel and the option signal, and generate the mask signal. |
