发明名称 LEAK CHECKING CAP OF SEMICONDUCTOR MANUFACTURING EQUIPMENT
摘要 PURPOSE: A leak checking cap of semiconductor manufacturing equipment is provided to check easily the leak of a flange and a sealing cap by installing the same between the flange and the sealing cap. CONSTITUTION: A bit of semiconductor manufacturing equipment includes a vertical furnace(110), a sealing cap, a flange, a sealing cap transfer apparatus(140), and a leak checking cap. The sealing cap(130) is used for sealing selectively a lower portion of the furnace and loading a wafer boat. The flange(120) for supplying reaction gas into the furnace and exhausting the reaction gas from the furnace is installed between the furnace and the sealing cap. The leak checking cap(180) includes a cap body(181) between the flange and the sealing cap, and a sealing member(184) for sealing a lower portion of the flange.
申请公布号 KR20040098146(A) 申请公布日期 2004.11.20
申请号 KR20030030349 申请日期 2003.05.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, HYEONG NAM
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
代理机构 代理人
主权项
地址