Temperature detection cell for integrated circuit, has test circuit determining threshold of detection of cell from voltages, that increase and decrease with temperature, at ambient temperature

摘要

The cell has a circuit producing a voltage that increases with temperature. A bipolar transistor (Q1) forms a circuit producing a voltage decreasing with temperature. A comparison circuit compares the two voltages for producing an alert signal when the temperature attains a detection threshold. A test circuit (22, RS) determines the detection threshold of the cell from the two voltages at an ambient temperature. The test circuit comprises a current source (22) and a resistance (RS). An independent claim is also included for a process for determining a detection threshold of temperature detection cell.