发明名称 Electrically programmable resistance cross point memory sensing method
摘要 A method of reading a selected resistive memory bit having its output connected to a bitline, which is connected to a plurality of unselected electrically parallel resistive memory bits, is provided. The method comprises selecting the resistive memory bit to be read by applying a read voltage to an input of the resistive memory bit, and unselecting the plurality of unselected resistive memory bits by applying a deselect voltage to all inputs of the unselected resistive memory bits. The current out of the bitline is then sensed by a current sensor. A memory device is also provided comprising a plurality of resistive memory bits connected to a shared bitline, a means for selecting a single bit from the plurality of resistive memory bits, a means for deselecting the remaining, unselected bits from the plurality of resistive memory bits and a means for sensing the output current from the bitline.
申请公布号 US6925001(B2) 申请公布日期 2005.08.02
申请号 US20040794309 申请日期 2004.03.03
申请人 SHARP LABORATORIES OF AMERICA, INC. 发明人 HSU SHENG TENG
分类号 G11C11/15;G11C11/56;G11C13/00;H01L27/24;(IPC1-7):G11C11/00 主分类号 G11C11/15
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